Another Ultrafast Microscopy Method | June 6, 2011 Issue - Vol. 89 Issue 23 | Chemical & Engineering News
Volume 89 Issue 23 | p. 39 | Concentrates
Issue Date: June 6, 2011

Another Ultrafast Microscopy Method

Laser-driven method adds femtosecond time resolution to scanning electron microscopy’s spatial resolution
Department: Science & Technology
News Channels: Analytical SCENE
Keywords: Zewail, ultrafast electron microscopy, TEM, scanning transmission electron microscopy

Scanning transmission electron microscopy (STEM) has joined the ultrafast four-dimensional TEM club, researchers at Caltech report (J. Am. Chem. Soc., DOI: 10.1021/ja203821y). The development, which combines 3-D nanoscale spatial resolution of conventional TEM with femtosecond temporal resolution, may enable researchers to probe subtle specimen motions and morphological changes in materials and biological sciences. During the past few years, Ahmed H. Zewail and coworkers have developed laser-based methods for conducting pulsed TEM experiments. . . .

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