Issue Date: June 6, 2011
Another Ultrafast Microscopy Method
Scanning transmission electron microscopy (STEM) has joined the ultrafast four-dimensional TEM club, researchers at Caltech report (J. Am. Chem. Soc., DOI: 10.1021/ja203821y). The development, which combines 3-D nanoscale spatial resolution of conventional TEM with femtosecond temporal resolution, may enable researchers to probe subtle specimen motions and morphological changes in materials and biological sciences. During the past few years, Ahmed H. Zewail and coworkers have developed laser-based methods for conducting pulsed TEM experiments. . . .
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