Advertisement

This site uses cookies to enhance your user experience. By continuing to use this site you are agreeing to our COOKIE POLICY.

ACCEPT AND CLOSE

If you have an ACS member number, please enter it here so we can link this account to your membership. (optional)

ACS values your privacy. By submitting your information, you are gaining access to C&EN and subscribing to our weekly newsletter. We use the information you provide to make your reading experience better, and we will never sell your data to third party members.

The key to knowledge is in your (nitrile-gloved) hands

Already an ACS Member?  

Basic

$0 Community Associate

ACS’s Basic Package keeps you connected with C&EN and ACS.

  • Access to 6 digital C&EN articles per month on cen.acs.org
  • Weekly delivery of the C&EN Essential newsletter
JOIN NOW
Standard

$80 Regular Members & Society Affiliates

ACS’s Standard Package lets you stay up to date with C&EN, stay active in ACS, and save.

Eligibility restrictions apply. Review ACS Membership Packages to see if you qualify.

JOIN NOW
Premium

$160 Regular Members & Society Affiliates
$55 Graduate Students
$25 Undergraduate Students

ACS’s Premium Package gives you full access to C&EN and everything the ACS Community has to offer.

  • Unlimited access to C&EN’s daily news coverage on cen.acs.org
  • Weekly delivery of the C&EN Magazine in print or digital format
  • Access to our Chemistry News by C&EN mobile app
  • Significant discounts on registration for most ACS-sponsored meetings
ACS offers discounts for some countries outside the United States. This discount is shown at checkout, if applicable.

JOIN NOW

Thank you!

Your account has been created successfully, and a confirmation email is on the way.

Your username is now your ACS ID.

ENJOY UNLIMITED ACCES TO C&EN

Analytical Chemistry

Anasys Licenses Imaging Technology

by Marc S. Reisch
April 21, 2014 | A version of this story appeared in Volume 92, Issue 16
Advertisement

Most Popular in Analytical Chemistry

[+]Enlarge
Credit: Oak Ridge National Laboratory
Image shows heated atomic force microscope probe on a sample. Surface material is drawn as vapor into the ion source of a mass spectrometer.
Heated atomic force microscope probe on a sample. Surface material is drawn as vapor into the ion source of a mass spectrometer.
Credit: Oak Ridge National Laboratory
Image shows heated atomic force microscope probe on a sample. Surface material is drawn as vapor into the ion source of a mass spectrometer.

Anasys Instruments has licensed a technology from Oak Ridge National Laboratory that combines atomic force microscopy with mass spectrometry. The technology allows simultaneous physical and chemical characterization of samples and could expand research in areas ranging from energy materials to drug discovery. The technology makes possible image resolutions as small as 250 nm.

Article:

This article has been sent to the following recipient:

0 /1 FREE ARTICLES LEFT THIS MONTH Remaining
Chemistry matters. Join us to get the news you need.
GET MORE
GET MORE