Volume 93 Issue 19 | p. 26 | Concentrates
Issue Date: May 11, 2015

AFM Coupled With Mass Spec Plots Properties Of Materials With A Single Platform

Chemical Mapping: New analytical tool boasts high resolution under ambient conditions
Department: Science & Technology
Keywords: Atomic force microscopy, AFM, mass spec, chemical map

Researchers at Oak Ridge National Laboratory have developed an instrument capable of probing a surface’s physical and chemical properties with unprecedented resolution under ambient conditions (ACS Nano 2015, DOI: 10.1021/acsnano.5b00659). Working in collaboration with Anasys Instruments, a company focused on nanoscale analytics, the team coupled atomic force microscopy and . . .

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