Issue Date: May 11, 2015
AFM Coupled With Mass Spec Plots Properties Of Materials With A Single Platform
Researchers at Oak Ridge National Laboratory have developed an instrument capable of probing a surface’s physical and chemical properties with unprecedented resolution under ambient conditions (ACS Nano 2015, DOI: 10.1021/acsnano.5b00659). Working in collaboration with Anasys Instruments, a company focused on nanoscale analytics, the team coupled atomic force microscopy and . . .
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