Advances in TERS Applications
Thursday, September 27, 2012
USA 11:00 a.m. EDT / 10:00 a.m. CDT / 8:00 a.m. PDT / 15:00 GMT
Who should attend?
Physicists, Chemists, and Engineers interested in:
• Chemical identification at the nanometer single size scale
• Advanced techniques in SPM
• Advanced techniques in optical spectroscopy
• Applications in polymer development and engineering
• Applications in nanomaterials development and engineers
Nano Surfaces Division
Elizabeth K. Wilson
Atomic Force Microscopy as well as Raman Spectroscopy have become indispensable tools in many areas of science and technology. PeakForce Tapping allows the AFM to measure nano-mechanical properties with true atomic resolution but has a gap in that it lacks chemical specificity. Confocal Raman spectroscopy on the other hand fills this gap but has the shortcoming of being a diffraction limited technique. That gap is addressed by Tip Enhanced Raman Scattering. We will discuss the origin of the technique as well as setups and selected application examples.