Advances in TERS Applications
 
 
CEN Webinars: Stronger Bonds

Advances in TERS Applications

 

Thursday, September 27, 2012

USA 11:00 a.m. EDT / 10:00 a.m. CDT / 8:00 a.m. PDT / 15:00 GMT

 

Who should attend?


Physicists, Chemists, and Engineers interested in:

• Chemical identification at the nanometer single size scale
• Advanced techniques in SPM
• Advanced techniques in optical spectroscopy
• Applications in polymer development and engineering
• Applications in nanomaterials development and engineers

Speaker


Stefan Kaemmer
Application Scientist
Nano Surfaces Division
Bruker


Moderator


Elizabeth K. Wilson
Senior Editor
C&EN
 


 

 

Overview:


Atomic Force Microscopy as well as Raman Spectroscopy have become indispensable tools in many areas of science and technology. PeakForce Tapping allows the AFM to measure nano-mechanical properties with true atomic resolution but has a gap in that it lacks chemical specificity. Confocal Raman spectroscopy on the other hand fills this gap but has the shortcoming of being a diffraction limited technique. That gap is addressed by Tip Enhanced Raman Scattering. We will discuss the origin of the technique as well as setups and selected application examples.

 

 

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