Overview:

Atomic Force Microscopy as well as Raman Spectroscopy have become indispensable tools in many areas of science and technology. PeakForce Tapping allows the AFM to measure nano-mechanical properties with true atomic resolution but has a gap in that it lacks chemical specificity. Confocal Raman spectroscopy on the other hand fills this gap but has the shortcoming of being a diffraction limited technique. That gap is addressed by Tip Enhanced Raman Scattering. We will discuss the origin of the technique as well as setups and selected application examples.