Introducing A New Rapid Trace Gas and Headspace Analysis Technology: SIFT-MS

December 7, 2016

8:00 a.m. PST / 11:00 a.m. EST / 16:00 GMT / 17:00 CET

Register Now

 
 

Overview

 

SIFT-MS is a revolutionary advance in trace gas and headspace analysis. SIFT-MS analysis is real-time, comprehensive, selective, and economical. Ingenious application of direct, ultra-soft chemical ionization coupled with mass spectrometric detection makes continuous monitoring simple for both routine and chromatographically challenging compounds (e.g. ammonia, formaldehyde, hydrogen chloride, and hydrogen sulfide).

Direct, broad-spectrum analysis using SIFT-MS provides new opportunities across an extremely wide range of applications. In this webinar, example applications will include formaldehyde analysis to trace levels in air and headspace, real-time ambient air monitoring for VOCs and odorous compounds, and very high-throughput screening of polymers and packaging.

Brought to you by:

 

Participants Will Learn:

 

• The fundamentals of the selected ion flow tube mass spectrometry (SIFT-MS) analytical technique.

• How SIFT-MS delivers immediate analytical results to ppt concentrations with very high selectivity through application of multiple rapidly switchable positive and negative reagent ions coupled with mass spectrometric detection.

• How SIFT-MS compares with traditional gas analysis methods, including GC-MS and HPLC.

Who Should Attend:

 

• Analytical chemists and process engineers in the environmental, food, petrochemical, and polymer industries

• Researchers / R&D Managers

• Laboratory Managers / Directors / Supervisors

• Laboratory Technicians / Operators

• QA/QC managers and scientists

 

Speakers

 
Dr. Mark Perkins, Ph. D.,
Senior Applications Chemist,
Anatune Limited
Dr. Vaughan Langford, Ph. D.,
Director of Applications and Marketing,
Syft Technologies
 

Moderator

 
Britt Erikson,
Senior Editor,
C&EN
 

Register Now