Volume 88 Issue 2 | p. 34 | Concentrates
Issue Date: January 11, 2010

Speedy Nonlinear Optical Analysis

Combining novel laser-probe method with fast statistical evaluation speeds up thin-film analysis
Department: Science & Technology
News Channels: Analytical SCENE
Keywords: nonlinear optical, ellipsometry, thin films, polarization

Combining a novel laser-probe method with a fast data-analysis technique enables scientists to rapidly differentiate chemically distinct thin films solely on the basis of subtle differences in the optical properties, according to a research team at Purdue University (Anal. Chem., DOI: 10.1021/ac901832u). Changes in the polarization of light reflected from thin films can serve as a probe of the structure, orientation, and . . .

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