Latest News
Web Date: October 13, 2011

Pushing Raman To The Nanoscale

Materials Analysis: Imaging method reveals nanometer-sized defects and contaminants on graphene
Department: Science & Technology
News Channels: Analytical SCENE, Materials SCENE
Keywords: graphene, Raman spectroscopy, tip enhance, confocal

Structural defects and impurities in graphene can be pinpointed with improved resolution—in the low-nanometer range—by a spectroscopy method that can quickly image large areas of the film, researchers in Switzerland report (ACS Nano, DOI: 10.1021/nn2035523). The advance may lead to routine quality control methods to assess the purity and structural integrity of graphene films used in electronics applications.

Research teams in labs around the globe are driving intensely . . .

To view the rest of this content, please log in with your ACS ID.

Chemical & Engineering News
ISSN 0009-2347
Copyright © American Chemical Society