Volume 95 Issue 1 | p. 6 | News of The Week
Issue Date: January 2, 2017 | Web Date: December 27, 2016

Researchers take superresolution microscopy to the next level

New method, dubbed MINFLUX, achieves nanometer resolution and fast analysis by combining the best of earlier imaging techniques
Department: Science & Technology
News Channels: Analytical SCENE
Keywords: imaging, superresolution microscopy, single-particle tracking, MINFLUX, STED, PALM

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