Volume 95 Issue 1 | p. 6 | News of The Week
Issue Date: January 2, 2017 | Web Date: December 27, 2016

Researchers take superresolution microscopy to the next level

New method, dubbed MINFLUX, achieves nanometer resolution and fast analysis by combining the best of earlier imaging techniques
Department: Science & Technology
News Channels: Analytical SCENE
Keywords: imaging, superresolution microscopy, single-particle tracking, MINFLUX, STED, PALM

. . .

To view the rest of this content, please log in with your ACS ID.

Chemical & Engineering News
ISSN 0009-2347
Copyright © American Chemical Society