Innovations in ICP-MS — Exploring the boundaries of elemental analysis capability
CEN Webinars: Stronger Bonds
Innovations in ICP-MS
Exploring the boundaries of elemental analysis capability
Tuesday April 15th 2014
8:00 a.m. PDT / 11:00 a.m. EDT / 15:00 GMT
SPEAKERS
Speaker
Ed McCurdy,
ICP-MS Product Marketing
Agilent Technologies
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MODERATOR
Moderator
Craig Bettenhausen,
Associate Editor
C&EN
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OVERVIEW

Teaching, research, and industrial labs that use ICP-MS have always had to accept certain limitations on their metals analysis – limited tolerance to high dissolved solids, and a dynamic range that is ideal for trace analytes (sub-ppt) but is unable to reach above a few 100s ppm for major element analysis. No longer!

Recent advances in ICP-MS technology, such as ultra-high matrix introduction (UHMI), allows the direct analysis of samples matrices that contain up to 25% total dissolved solids (TDS), such as saturated brine and hypersaline lake water. Further technological advances such as a new ion lens, revised interface vacuum configuration, and novel orthogonal detector system (ODS) combine to deliver both higher ion transmission and lower background. The result is significantly improved signal to noise, lower detection limits, up to 11 orders dynamic range (0.1cps to 10Gcps), and the ability to measure major elements (% levels) to trace elements (sub ppt) in the same run.

KEY LEARNING OBJECTIVES

- How hardware innovations affect performance

- How ICP-MS is changing metals analysis

- New ways of using ICP-MS including environmental, food, materials & nanoparticles analysis, clinical & life science applications, and more!

WHO SHOULD ATTEND
  • • Lab scientists currently analyzing for trace metals
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  • • Researchers looking to expand their elemental analysis capability
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  • • R&D and lab managers increasing their metals analysis workload
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