CEN Webinars: Stronger Bonds
DUAL VIEW ICP-OES MINUS THE WAIT.
Perform metals analysis in environmental samples up to 55% faster, using 50% less gas.
Thursday October 2nd 2014
8:00a.m. PDT / 11:00a.m. EDT / 16:00 BST
SPEAKER
Speaker
Ross Ashdown, M.App.Sci,
Product Manager
ICP-OES and MP-AES,
Agilent Technologies
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MODERATOR
Moderator
Linda Wang,
Senior Editor,,
C&EN
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OVERVIEW

The 5100 ICP-OES Synchronous Vertical Dual View (SVDV) heralds a new standard of speed, performance and simplicity for trace metal analysis. The design of this innovative new instrument enables metal analysis to be faster, using less gas, without compromising performance on your toughest samples. This presentation outlines the new technology and illustrates its performance on typical environmental samples.

To save time and money on your metals analysis, the 5100 SVDV uses a unique Dichroic Spectral Combiner which enables axial and radial emissions to be measured at the same time, not in a sequential fashion like traditional dual view. The 5100 also features a vertically oriented torch, which enables the instrument to easily handle the toughest matrices whilst providing axial sensitivity. Operation of the instrument has also been simplified with intuitive workflow software and easy to use sample introduction components. The 5100 ICP-OES revolutionizes metals analysis by ICP-OES.

KEY LEARNING OBJECTIVES:

- The advantage of a robust vertical plasma and uncompromised dual view analysis

- How the 5100 can maximize sample throughput with innovative technology.

- About the intuitive workflow of the software and the simplicity of method development

WHO SHOULD ATTEND
  • • Metals Lab Managers/Metals Lab Supervisors
  •  
  • • Industrial Analytical Chemists
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  • • ICP-OES Laboratory Technicians / ICP-OES Operators
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  • • Spectroscopy Academics and Researchers
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