USA 8:00 a.m. PST, 11:00 a.m. EST, 16:00 BST, 17:00 CEDT
GC Applications Engineer,
Agilent Technologies, Inc.
Assistant Managing Editor,
When you are under pressure to stay productive, profitable, and compliant, you cannot afford downtime caused by problems with your analytical column.
Daron Decker will be discussing Agilent J&W PLOT PT and DB- Sulfur SCD columns. Standard PLOT columns can be a challenge because of particle shedding. This may cause detector spikes, instrument/column flow restriction and plugging of switching valves. New Agilent J&W PLOT PT columns include integrated particle traps on both ends in one continuous length of fused silica capillary, significantly reducing particle shedding and keeping your system up and running longer.
- How to achieve outstanding results, while reducing spiking, particle shedding and bleed.
- Extend SCD detector stability when analyzing volatile sulfur compounds per ASTM methods.
- Reduce GC/SCD downtime with low-bleed columns optimized for sulfur analysis.
- See how easy it is to eliminate the need for unions and filters without compromising chromatographic performance.