High-Resolution Optical Characterization
of Nanostructures using Metal Antennas
Tuesday, June 11, 2013
USA 11:00 a.m. EDT, 10:00 a.m. CDT, 8:00 a.m. PDT, 16:00 BST
Achim Harschuh, Ph.D.
Professor at Ludwig-Maximilians-Universitaet Muenchen
Department Chemie and CeNS
Several concepts have been developed in the last decades to overcome the resolution limit of conventional optical microscopy imposed by diffraction. Powerful far-field methods that exploit particular properties of highly fluorescent emitters are capable of 3D imaging with nanoscale resolution. Near-field techniques, on the other hand, make use of the rapid decay of evanescent waves close to pointed probes to visualize sample surfaces. Optical antennas are a promising near-field scheme in which the length-mismatch between the wavelength of visible light and the dimensions of nanoscale objects is bridged by metal nanostructures.
• Basics of near-field optical microscopy and its experimental requirements
• Fundamentals of antenna-enhanced near-field optical microscopy and spectroscopy
• Experimental realizations
• Recent applications including photoluminescence, high-resolution raman and photocurrent microscopy of single inorganic nanowires and carbon nanotubes at a spatial resolution of about 20 nm