4 Key Advances in Particle Characterization Technology

4 Key Advances in Particle Characterization Technology

March 30, 2016

8:00 a.m. PST / 11:00 a.m. EST / 16:00 GMT / 17:00 CET

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This presentation will introduce the next generation in particle analysis: the Litesizer 500. The Litesizer 500 uses the Dynamic Light Scattering (DLS) technology to measure nano and microparticle size.

The novel cmPALS technology and the new Omega Cuvette enable faster and more sensitive Zeta Potential measurements that facilitate ease of use and improve sample stability. Additionally, the transmittance, or amount of light traveling through the sample, is constantly monitored to provide additional information about the sample turbidity and stability. Finally, improvements have been made to the particle size distribution algorithms to enable the resolution of bi- and tri-model particle mixtures.

A number of specific application examples will be described including analyzing mixed particle suspensions, liposomes for drug delivery, particles for ceramics and particles within the food and beverage industry.

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Particpants Will Learn:


• Benefits of the new cmPALS technology for particle analysis

• Benefits of the new Omega Cuvette for Zeta Potential Analysis

• Value of Transmission Analysis during particle size measurements

• The possibility of resolving the sizes of a 3-component particle suspension

Who Should Attend:


• Researchers/ R&D Mangagers

• Laboratory Managers/ Directors / Supervisors

• Laboratory Technicians / Operators



Stephen L. Hussey, PhD,
Director of Particle and Materials Characterization,
Anton Paar


Linda Wang,
Senior Editor,

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