CEN Webinars: Stronger Bonds
Nondestructive Characterization of Advanced Polymeric Materials Using Spectroscopy and Atomic Force Microscopy
Tuesday March 31st 2015
USA 11:00am EDT, 8:00 am PDT, 16:00 GMT
SPEAKERS
Speaker
Bede Pittenger, Ph.D.,
Senior Applications Scientist,
Bruker Nano Surfaces Division
 
Speaker
Thomas J Tague Jr, Ph.D.,
Applications Manager,
Bruker Optics, Inc.
Spacer
MODERATOR
Moderator
Ann Thayer,
Senior Editor,
C&EN
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OVERVIEW

This joint webinar will focus on polymer materials characterization using the highly complementary techniques of Atomic Force Microscopy (AFM) and vibrational (infrared and Raman) spectroscopy.

Infrared and Raman spectroscopy are ideal tools for characterizing unknown materials. The high degree of specificity of spectroscopic analysis makes it ideal for reverse engineering, quality control, defect analysis, and other applications. Infrared and Raman microanalysis is conducted when samples or areas of interest are smaller than approximately the width of a single hair fiber. The spectroscopic microanalysis of polymer based products will be discussed with emphasis on what level of detection can be achieved as well as what is entailed in performing the analysis.

KEY LEARNING OBJECTIVES:

- Infrared and Raman spectroscopy

- Atomic force microscopy

- Characterization of thin films and polymer materials at the micro- and nanoscale

WHO SHOULD ATTEND
  • • Practicioners of infrared and Raman spectroscopy and atomic force microscopy
  •  
  • • Researchers / R&D Mangagers
  •  
  • • Laboratory Managers / Directors / Supervisors
  •  
  • • Laboratory Technicians / Operators
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