Advanced Nanomaterials Characterization with Thermal Analysis and Hyphenated Techniques

Advanced Nanomaterials Characterization with Thermal Analysis and Hyphenated Techniques

July 12, 2016

8:00 a.m. PDT / 11:00 a.m. EDT / 16:00 BST / 17:00 CEST

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Overview

 

With the rapid growth of the nanotechnology market, the need for modern characterization techniques for nanomaterial analysis is increasing. This webinar illustrates some typical applications of thermal analysis and its coupling with FT-IR and GC/MS, along with various examples. Thermal analysis is a group of analytical techniques that measure the physical properties of a material (i.e. heat flow, mass, dimension) as a function of temperature. The evolved gases from a TGA experiment can be analyzed by FT-IR and GC/MS for identification and quantification, which allows more comprehensive characterization of the nanomaterials. These state-of-the-art interfacing techniques will be discussed.

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Particpants Will Learn:

 

• Characterization of nanomaterials with thermal analysis: DMA, DSC, TGA, and STA

• Interfacing and coupling techniques for hyphenating the TGA or STA with FT-IR and GC/MS

• Overview of various applications analyzing divers advanced materials/nanomaterials with the hyphenated techniques

Who Should Attend:

 

• Material Characterization Researchers & Practitioners

• Failure Analysis Labs

• Contract Labs

• QA/QC Labs

• Advanced Materials Manufacturer

• Nano Research: Government, Nanomedicine, Biomedical Nanotechnology

 

Speaker

 
Dr. Jun Wang, Ph.D.,
Senior Applications Scientist,
Perkin Elmer
 

Moderator

 
Alexandra Taylor,
Contributing Editor,
C&EN
 

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