Materials Characterization Spectroscopy, When Light and Matter Interact: Measuring Absorbance, Reflection, and Scattering In The UV/Vis/NIR Wavelength Region
CEN Webinars: Stronger Bonds
Materials Characterization Spectroscopy, When Light and Matter Interact: Measuring Absorbance, Reflection, and Scattering In The UV/Vis/NIR Wavelength Region
Wednesday August 5th 2015
USA 11:00am EDT, 8:00 am PDT, 16:00 BST
SPEAKER
Speaker
Jeffrey L. Taylor, Ph.D.,
Field Product Specialist for UV/Vis/NIR and Fluorescence Spectroscopy
PerkinElmer
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MODERATOR
Moderator
Jyllian Kemsley,
Senior Editor,
C&EN
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OVERVIEW

UV/Vis/NIR Spectroscopy is a commonly used technique for materials characterization of a wide variety of sample types. From solutions, to solid state samples, to nanomaterials, a wealth of information is available, but only if one knows how to properly execute the appropriate measurement.

This webcast will cover how specific measurement techniques including transmission, specular reflection, diffuse reflection, and angular resolved scattering can be employed to characterize just about any material. Also discussed will be how to select the proper sample preparation and spectrophotometer measurement configuration (accessory) that will yield meaningful and relevant information to the user.

KEY LEARNING OBJECTIVES:

- Participants Will Learn Spectroscopy

- Techniques and Capabilities in:

  Specular Reflection

  Diffuse Reflection

  Angular Resolved Scattering Measurement

WHO SHOULD ATTEND
  • • UV/Vis/NIR instrument practitioners
  •  
  • • Material Characterization Researchers
  •  
  • • Nano Material Researchers
  •  
  • • Spectroscopy Technicians & Operators
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