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_____ Brought to you by Syft Technologies _____

Rapid Volatile Impurity Analysis in Pharmaceutical Products Using SIFT-MS

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  March 26, 2020

  8:00 a.m. PST / 11:00 p.m. EST / 16:00 GMT / 17:00 CET - Duration: 60 Minutes

 

Overview

 

Volatile compounds occur frequently as impurities in pharmaceutical products and are often of concern due their toxicity. SIFT-MS is a new tool for real-time, selective and economical trace gas and headspace analysis of volatile compounds, including chromatographically challenging ones such as formaldehyde, formic acid, and ammonia.

Direct, broad-spectrum analysis using SIFT-MS provides new opportunities across multiple pharmaceutical applications, including:
• Simple formaldehyde analysis • Residual solvent analysis • Packaging screening, including residual monomer analysis.

Join us for this webinar to learn more about how SIFT-MS works and how it speeds and simplifies common volatile analyses for the pharma industry.

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Key Learning Objectives

  • The fundamentals of the selected ion flow tube mass spectrometry (SIFT-MS) technique, including its ability to selectively and comprehensively analyze samples in one, simple procedure.
  • How SIFT-MS can greatly increase sample throughput for residual monomer and residual solvent analysis.
  • Understand - from a formaldehyde case study - how SIFT-MS can eliminate sample preparation through direct analysis.

Who Should Attend

  • Analytical chemists
  • Polymer chemists
  • Packaging technologists
  • Researchers / R&D Managers
  • Laboratory Managers / Directors / Supervisors
  • QA/QC managers and scientists
 

Speakers

Vaughan Langford, PhD
Principal Scientist,
Syft Technologies, New Zealand
Mark Perkins, PhD
Senior Applications Chemist,
Anatune Limited, United Kingdom
 

Moderator

Jeff Huber
Contributing Editor,
C&EN Media Group
 

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