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Rapid Volatile Impurity Analysis in Pharmaceutical Products Using SIFT-MS

November 15, 2017

8:00 a.m. PST / 11:00 a.m. EST / 16:00 GMT / 17:00 CET

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Overview

 

Volatile compounds occur frequently as impurities in pharmaceutical products and are often of concern due their toxicity. SIFT-MS is a new tool for real-time, selective and economical trace gas and headspace analysis of volatile compounds, including chromatographically challenging ones such as formaldehyde, formic acid, and ammonia.

Direct, broad-spectrum analysis using SIFT-MS provides new opportunities across multiple pharmaceutical applications, including:
• Simple formaldehyde analysis
• Residual solvent analysis
• Packaging screening, including residual monomer analysis.

Join us for this web seminar to learn more about how SIFT-MS works and how it speeds and simplifies common pharma VOC analysis applications.

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Participants Will Learn:

 

• The fundamentals of the selected ion flow tube mass spectrometry (SIFT-MS) technique, including its ability to selectively and comprehensively analyze samples in one, simple procedure.

• How SIFT-MS can greatly increase sample throughput for residual monomer and residual solvent analysis.

• Understand from a formaldehyde case study, how SIFT-MS can eliminate sample preparation through direct analysis.

Who Should Attend:

 

• Food researchers

• Analytical chemists

• Polymer chemists

• Packaging technologists

• Researchers/ R&D Mangagers

• Laboratory Managers/ Directors / Supervisors

• QA/QC managers and scientists

 

Speakers

 
Dr. Vaughan Langford, Ph.D.,
Director of Applications and Marketing,
Syft Technologies
Dr. Mark Perkins, Ph.D.,
Senior Applications Chemist,
Anatune Limited
 

Moderator

 
Mitch Jacoby
Senior Correspondent
C&EN
 

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