Graphene Lends Microscopy Support | July 20, 2009 Issue - Vol. 87 Issue 29 | Chemical & Engineering News
 
 
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Volume 87 Issue 29 | p. 38 | Concentrates
Issue Date: July 20, 2009

Graphene Lends Microscopy Support

Berkeley researchers demonstrate the carbon sheet's utility in a novel application: as a specimen support in transmission electron microscopy
Department: Science & Technology
Keywords: graphene, transmission electron microscopy

Graphene’s single-carbon-atom thickness, exceptional mechanical strength, and electrical conductivity are driving researchers to develop all sorts of nanoelectronic devices, supercapacitors, and polymer-based composites. Zonghoon Lee, Ki-Joon Jeon, and coworkers of the University of California, Berkeley, and Lawrence Berkeley National Laboratory have now demonstrated graphene’s utility in an altogether different application: as a specimen support in transmission electron microscopy (Nano Lett., DOI: 10.1021/nl901664k). Conventional TEM carbon . . .

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