Issue Date: November 2, 2009
Microscopy Method Achieves Nanoscale Diffraction
Caltech’s Ahmed H. Zewail and Aycan Yurtsever have achieved four-dimensional nanoscale diffraction by combining two existing techniques: convergent-beam electron diffraction and ultrafast electron microscopy (Science 2009, 326, 708). In convergent-beam ultrafast electron microscopy (CB-UEM), the researchers focus femtosecond electron pulses into a nanometer-sized beam that strikes the sample. They then initiate physical changes in the sample with femtosecond laser pulses and observe the changes with time-delayed electron pulses. The convergent electron beam allows . . .
You Do Not Have Access to C&EN Protected Content.
- Chemical & Engineering News
- ISSN 0009-2347
- Copyright © American Chemical Society