Microscopy Method Achieves Nanoscale Diffraction | November 2, 2009 Issue - Vol. 87 Issue 44 | Chemical & Engineering News
 
 
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Volume 87 Issue 44 | p. 26 | Concentrates
Issue Date: November 2, 2009

Microscopy Method Achieves Nanoscale Diffraction

Combining convergent-beam electron diffraction and ultrafast electron microscopy creates an even faster electron microscopy technique
Department: Science & Technology
Keywords: convergent-beam electron diffraction, electron microscopy

Caltech’s Ahmed H. Zewail and Aycan Yurtsever have achieved four-dimensional nanoscale diffraction by combining two existing techniques: convergent-beam electron diffraction and ultrafast electron microscopy (Science 2009, 326, 708). In convergent-beam ultrafast electron microscopy (CB-UEM), the researchers focus femtosecond electron pulses into a nanometer-sized beam that strikes the sample. They then initiate physical changes in the sample with femtosecond laser pulses and observe the changes with time-delayed electron pulses. The convergent electron beam allows . . .

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