Web Date: October 13, 2011
Pushing Raman To The Nanoscale
Structural defects and impurities in graphene can be pinpointed with improved resolution—in the low-nanometer range—by a spectroscopy method that can quickly image large areas of the film, researchers in Switzerland report (ACS Nano, DOI: 10.1021/nn2035523). The advance may lead to routine quality control methods to assess the purity and structural integrity of graphene films used in electronics applications.
Research teams in labs around the globe are driving intensely . . .
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