Optical Method Measures Graphene Quality | Chemical & Engineering News
Latest News
Web Date: July 30, 2014

Optical Method Measures Graphene Quality

Materials: A technique uses polarized light to characterize the quality and thickness of graphene quickly and efficiently
Department: Science & Technology
News Channels: Materials SCENE, Nano SCENE, Analytical SCENE
Keywords: graphene, thin films, spectroscopic ellipsometry, Raman spectroscopy, defects

Graphene’s remarkable electrical and optical properties might lead to a new generation of computer chips, photovoltaic cells, and other devices. To make such devices practical, however, graphene has to be produced at an industrial scale, which means manufacturers need rapid ways to monitor the quality of their material. Now scientists in Taiwan have shown that a method long used for measuring the thickness of thin films provides . . .

You Do Not Have Access to C&EN Protected Content.

Chemical & Engineering News
ISSN 0009-2347
Copyright © American Chemical Society