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Analytical Chemistry

Anasys Licenses Imaging Technology

by Marc S. Reisch
April 21, 2014 | APPEARED IN VOLUME 92, ISSUE 16

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Credit: Oak Ridge National Laboratory
Image shows heated atomic force microscope probe on a sample. Surface material is drawn as vapor into the ion source of a mass spectrometer.
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Credit: Oak Ridge National Laboratory
Image shows heated atomic force microscope probe on a sample. Surface material is drawn as vapor into the ion source of a mass spectrometer.

Anasys Instruments has licensed a technology from Oak Ridge National Laboratory that combines atomic force microscopy with mass spectrometry. The technology allows simultaneous physical and chemical characterization of samples and could expand research in areas ranging from energy materials to drug discovery. The technology makes possible image resolutions as small as 250 nm.

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